The NewView™ 9000 with Coherence Scanning Interferometry (CSI) technology is a versatile 3D optical surface profiler developed by ZYGO. It offers a wide range of capabilities for non-contact optical surface profiling, making it suitable for various applications. Here are some key features and benefits of the NewView™ 9000:

  • Surface Measurement Versatility: The NewView™ 9000 can measure a diverse range of surface types, including smooth, rough, flat, sloped, and stepped surfaces. It is capable of providing precise measurements for different surface characteristics. 
  • Non-Destructive and Fast: All measurements conducted with this system are non-destructive, quick, and do not require any sample preparation, making it efficient for research and manufacturing purposes.
  • Coherence Scanning Interferometry (CSI) Technology: The core technology of the NewView™ 9000 is CSI, which offers sub-nanometer precision at all magnifications. This technology allows for faster and more precise measurements compared to other available technologies, ensuring a high return on investment.
  • Performance and Value: The system offers exceptional value with a wide range of applications, including measuring flatness, roughness, waviness, thin films, step heights, and more. It is highly accurate, easy to use, and provides fast measurements, all at a competitive price point.
  • Triple-Zoom Turret: The NewView 9000 comes equipped with a triple-zoom turret that can be customized with discrete zoom optics. This allows users to tailor the system to their specific measurement needs.
  • Sample Staging Options: The system offers flexible sample staging configurations, ranging from fully manual to fully automated with encoded travel. This flexibility caters to various user requirements and preferences.
  • High-Speed Measurements: The NewView™ 9000 excels in productivity and process control with its high-speed measurements, which take only seconds to complete.
  • Gage-Capable Performance: It offers exceptional precision and repeatability, making it suitable for demanding production applications that require accurate and consistent measurements.
  • Vibration Robustness: The SureScan technology and built-in isolation system ensure reliable metrology even in vibration-prone environments, enhancing measurement quality.
  • SmartPSI™ Technology: This technology allows for ultra-fast profiling of ultra-smooth surfaces, meeting the needs of industries where such surfaces are crucial.
  • 2D and 3D Correlation: The system provides confidence in measurements by offering 2D and 3D correlation results that comply with ISO 25178 and ISO 4287 standards.
  • Mx™ Software: The NewView 9000 comes with Mx™ software for instrument control, analysis, and measurement automation, making it user-friendly and efficient.
  • Flexible Configurations: The system features an open work area, various sample staging options, and the possibility of benchtop or production-style installations with an optional stand and workstation.

In summary, the NewView™ 9000 with CSI technology is a highly versatile and precise 3D optical surface profiler suitable for a wide range of applications. Its flexibility, speed, and advanced features make it a valuable tool for researchers and manufacturers seeking accurate and efficient surface measurements. Avantier can harness the merits of NewView for its optical metrology service by offering precise, versatile, efficient, and cost-effective measurement solutions. By doing so, Avantier can contribute to its customers’ success by assisting them in maintaining quality, improving efficiency, and driving innovation in their respective industries. This partnership between Avantier and NewView can lead to mutually beneficial outcomes and strengthen Avantier’s position as a leader in optical metrology services.


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